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Printed Circuit Board Design and Layout Questions

1. What is PCB Expert System Software? How is it different from design-rule checking software?

Computer modeling software based on Electromagnetic Compatibility (EMC) expert system algorithms can be used to identify problems with a printed circuit board layout before the first hardware is built. Unlike numerical EM modeling software (which solves for fields due to specific structures) or EMC design rule checkers (which look for layout features that violate selected design guidelines), expert system tools examine boards in much the same manner as a professional EMC engineer. They evaluate possible EMI sources, coupling paths and antennas, then identify and rank potential EMC problems.

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EMC Expert Systems


[1] K. Nageswara Rao, P. Venkata Ramana, M. V. Krishnamurthy, K. Zinnias, “ EMC analysis in PCB designs using an expert system,” Electromagnetic Interference and Compatibility, 1995 International Conference, Madras, India, Dec. 1995, pp. 59-62.

[2] T. Hubing, J. Drewniak, T. Van Doren and N. Kashyap, “An expert system approach to EMC modeling,” Proc. 1996 IEEE Int. Symp. Electromag. Compat., Santa Clara, CA, Aug. 1996, pp. 200-203.

[3] N. Kashyap, T. Hubing, J. Drewniak and T. Van Doren, “An expert system for predicting radiated EMI from PCB’s,” Proc. 1997 IEEE Int. Symp. Electromag. Compat., Aug. 1997, pp. 444-449.

[4] S. Ranganathan, D. Beetner, R. Wiese and T. Hubing, “An expert system architecture to detect system-level automotive EMC problems,” Proc. 2002 IEEE Int. Symp. Electromag. Compat., Minneapolis, MN, Aug. 2002, pp. 976-981.

[5] H. Shim, T. Hubing, T. Van Doren, R. DuBroff, J. Drewniak, D. Pommerenke and R. Kaires, “Expert system algorithms for identifying radiated emission problems in printed circuit boards,” Proc. 2004 IEEE Int. Symp. Electromag. Compat., Santa Clara, CA, Aug. 2004, pp. 57-62.

[6] Y. Fu and T. Hubing, "Analysis Of Radiated Emissions From A Printed Circuit Board Using Expert System Algorithms," IEEE Trans. on Electromagnetic Compatibility, vol. 49, no. 1, Feb. 2007, pp. 68-75.